Cosentino, GiuseppeCrupi, Felice2024-03-072024-03-072021-05-05https://hdl.handle.net/10955/5449Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica Dottorato di Ricerca in ICT. Ciclo XXXIIIenSiC Power MOSFETsDefectivenessThreshold-Voltage InstabilityPBTI, flicker noiseResearch Subject Categories::TECHNOLOGY::Information technology::Computer engineeringStudy characterization of modern 4h-sic power mosfetsFThesis